{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T13:45:38Z","timestamp":1772113538952,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252429","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T17:22:30Z","timestamp":1516209750000},"page":"132-135","source":"Crossref","is-referenced-by-count":4,"title":["A low-offset dynamic comparator with input offset-cancellation"],"prefix":"10.1109","author":[{"given":"Ruihan","family":"Pei","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jia","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xian","family":"Tang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fule","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhihua","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2008.4708780"},{"key":"ref3","first-page":"566","article-title":"A 0.16pJ\/Conversion-Step 2.5m W 1.25GS\/s 4b ADC in a 90nm digital CMOS process","author":"van","year":"2006","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2009.5357221"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865646"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373420"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-011-9687-5"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","location":"Guiyang","start":{"date-parts":[[2017,10,25]]},"end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252429.pdf?arnumber=8252429","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,15]],"date-time":"2018-02-15T10:56:32Z","timestamp":1518692192000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252429\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252429","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}