{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:29:34Z","timestamp":1729661374908,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252515","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T22:22:30Z","timestamp":1516227750000},"page":"468-471","source":"Crossref","is-referenced-by-count":0,"title":["Ultralow power loss integratable high-voltage MOSFETs"],"prefix":"10.1109","author":[{"given":"Xiaorong","family":"Luo","sequence":"first","affiliation":[]},{"given":"Weiwei","family":"Ge","sequence":"additional","affiliation":[]},{"given":"Bo","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"171","author":"wei","year":"2016","journal-title":"ISPSD"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2589322"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2090938"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2295091"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2466694"},{"key":"ref5","first-page":"395","author":"ng","year":"2001","journal-title":"ISPSD"},{"key":"ref8","first-page":"4304","volume":"12","author":"luo","year":"2014","journal-title":"IEEE Trans Electron Devices"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"774","DOI":"10.1109\/LED.2014.2326185","volume":"7","author":"qiao","year":"2014","journal-title":"IEEE Electron Device Lett"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2533022"},{"key":"ref9","first-page":"233","author":"varadarajan","year":"2007","journal-title":"ISPSD"},{"key":"ref1","first-page":"45","author":"vestling","year":"2007","journal-title":"ISPSD"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252515.pdf?arnumber=8252515","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,25]],"date-time":"2020-10-25T19:35:48Z","timestamp":1603654548000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252515\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252515","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}