{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T21:58:05Z","timestamp":1729634285309,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252517","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T22:22:30Z","timestamp":1516227750000},"page":"476-479","source":"Crossref","is-referenced-by-count":0,"title":["A universal approach for signal dependent circuit reliability simulation"],"prefix":"10.1109","author":[{"given":"Lining","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenyue","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mansun","family":"Chan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"709","author":"ma","year":"2016","journal-title":"Proc of SSDM"},{"key":"ref3","first-page":"43","author":"li","year":"2016","journal-title":"Proc of IPFA"},{"journal-title":"Proc of ISIC","year":"2016","author":"jiang","key":"ref5"},{"journal-title":"Proc WCM","year":"2016","author":"zhang","key":"ref2"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"375","DOI":"10.1109\/T-ED.1985.21952","article-title":"Hot-electron-induced MOSFET degradation - model, monitor and improvement","volume":"32","author":"hu","year":"1985","journal-title":"IEEE Transactions on Electron Devices"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252517.pdf?arnumber=8252517","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,9]],"date-time":"2019-10-09T13:29:29Z","timestamp":1570627769000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252517\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252517","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}