{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:36:52Z","timestamp":1729669012452,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252572","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T22:22:30Z","timestamp":1516227750000},"page":"702-705","source":"Crossref","is-referenced-by-count":0,"title":["A novel positive-feedback read scheme with tail current source of STT-MRAM"],"prefix":"10.1109","author":[{"given":"Jin","family":"Yan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongsheng","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuecheng","family":"Zou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bangdi","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Electron Devices Meeting","year":"2017","author":"song","key":"ref4"},{"key":"ref3","first-page":"1","author":"kang","year":"2016","journal-title":"IEEE Transactions on Circuits and Systems I Regular Papers"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2014.2357054"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2203589"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2327337"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2601330"},{"key":"ref2","first-page":"1","author":"kang","year":"2015","journal-title":"IEEE"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2294095"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"1449","DOI":"10.1109\/JPROC.2016.2521712","volume":"104","author":"fong","year":"2016","journal-title":"Proceedings of the IEEE"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252572.pdf?arnumber=8252572","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,9]],"date-time":"2019-10-09T13:29:06Z","timestamp":1570627746000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252572\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252572","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}