{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:50:16Z","timestamp":1730199016388,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252604","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T17:22:30Z","timestamp":1516209750000},"page":"826-829","source":"Crossref","is-referenced-by-count":0,"title":["CMOS 0.35\u03bcm implementation of time-domain measurement of resonator's quality factor"],"prefix":"10.1109","author":[{"given":"Xiaojiao","family":"Ren","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicolas","family":"Llaser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6572191"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2172998"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(01)02059-9"},{"key":"ref5","first-page":"2730","article-title":"Exploiting Time Domain Approach for Extremely High Q-Factor Measurement","volume":"64","author":"zhang","year":"2015","journal-title":"IEEE Transactions"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/68.789726"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.368498"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252604.pdf?arnumber=8252604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,15]],"date-time":"2018-02-15T10:56:57Z","timestamp":1518692217000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252604\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252604","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}