{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:20:22Z","timestamp":1729660822111,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/asicon.2017.8252648","type":"proceedings-article","created":{"date-parts":[[2018,1,17]],"date-time":"2018-01-17T17:22:30Z","timestamp":1516209750000},"page":"1005-1008","source":"Crossref","is-referenced-by-count":0,"title":["A low-power self-calibration digital-output CMOS temperature sensor with \u00b10.1\u00b0C inaccuracy from \u221240\u00b0C to 85\u00b0C"],"prefix":"10.1109","author":[{"given":"Yuze","family":"Niu","sequence":"first","affiliation":[]},{"given":"Wengao","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Yacong","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Shanzhe","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Zhongjian","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"208","article-title":"A CMOS temperature sensor with a voltage-calibrated inaccuracy of ±0.15°C (3?) from ?55°C to 125°C","author":"souri","year":"2012","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144290"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6572039"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2076610"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"2127","DOI":"10.1109\/JSSC.2015.2434845","article-title":"An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4 °C (3?) From 40 °C to 130 °C","volume":"50","author":"xiao","year":"2015","journal-title":"IEEE Journal of Solid State Circuits"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168646"},{"key":"ref2","first-page":"292","article-title":"A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of ± 0.15 °C (3?) From ?55°C to 125°C","author":"kamran","year":"2013","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"key":"ref1","first-page":"2621","article-title":"A CMOS On-Chip Temperature Sensor with-0.21 °C\/ 0.17 °C Inaccuracy from-20 °C to 100 °C","author":"chen","year":"2013","journal-title":"IEEE International Symposium on Circuits and Systems (ISCAS)"}],"event":{"name":"2017 IEEE 12th International Conference on ASIC (ASICON)","start":{"date-parts":[[2017,10,25]]},"location":"Guiyang","end":{"date-parts":[[2017,10,28]]}},"container-title":["2017 IEEE 12th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240668\/8252386\/08252648.pdf?arnumber=8252648","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,9]],"date-time":"2019-10-09T09:29:36Z","timestamp":1570613376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252648\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/asicon.2017.8252648","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}