{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:02:11Z","timestamp":1754161331326,"version":"3.41.2"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/asicon47005.2019.8983478","type":"proceedings-article","created":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T01:04:26Z","timestamp":1581037466000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Defect-Tolerant and Energy-Efficient Training of Multi-Valued and Binary Memristor Crossbars for Near-Sensor Cognitive Computing"],"prefix":"10.1109","author":[{"given":"Khoa","family":"Van Pham","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Kookmin University,Seoul,Korea,02707"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tien","family":"Van Nguyen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Kookmin University,Seoul,Korea,02707"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyeong-Sik","family":"Min","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Kookmin University,Seoul,Korea,02707"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TETCI.2018.2829919"},{"key":"ref11","volume":"10","author":"pham","year":"2019","journal-title":"Micromachines"},{"key":"ref12","volume":"10","author":"pham","year":"2019","journal-title":"Micromachines"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"986","DOI":"10.1049\/el:19950685","author":"klein","year":"1995","journal-title":"Electronics Letters"},{"key":"ref14","first-page":"568","volume":"18","author":"pham","year":"2018","journal-title":"SC Technology"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"2726","DOI":"10.1109\/TCSI.2018.2812419","author":"jiang","year":"2018","journal-title":"IEEE Trans Circuits Syst I Reg Papers 65 9"},{"key":"ref16","first-page":"128","author":"suh","year":"1995","journal-title":"ISSCC"},{"year":"2018","author":"krizhevsky","key":"ref17"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"3198","DOI":"10.1109\/JSEN.2018.2808285","author":"abunahla","year":"2018","journal-title":"IEEE Sens J"},{"key":"ref3","first-page":"1","author":"plastiras","year":"2018","journal-title":"2018 IEEE 29th (ASAP)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"journal-title":"Nanoarch","year":"2017","author":"bhat","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2016.1600492CM"},{"journal-title":"IBM T J Watson Research center","year":"2016","author":"hamann","key":"ref1"},{"key":"ref9","first-page":"1","author":"hu","year":"2016","journal-title":"53nd ACM\/EDAC\/IEEE (DAC)"}],"event":{"name":"2019 IEEE 13th International Conference on ASIC (ASICON)","start":{"date-parts":[[2019,10,29]]},"location":"Chongqing, China","end":{"date-parts":[[2019,11,1]]}},"container-title":["2019 IEEE 13th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8963812\/8983425\/08983478.pdf?arnumber=8983478","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,28]],"date-time":"2025-07-28T19:40:31Z","timestamp":1753731631000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8983478\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/asicon47005.2019.8983478","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}