{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:04:01Z","timestamp":1756771441639,"version":"3.44.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/asicon47005.2019.8983491","type":"proceedings-article","created":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T01:04:26Z","timestamp":1581037466000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["A Compact Memory Structure based on 2T1R Against Single-Event Upset in RRAM Arrays"],"prefix":"10.1109","author":[{"given":"Yu","family":"Ma","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210"}]},{"given":"Dingcheng","family":"Jia","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210"}]},{"given":"Huifan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210"}]},{"given":"Ruoyu","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210"}]},{"given":"Pingqiang","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Shanghaitech University,Shanghai,China,201210"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2830791"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2630022"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2492421"},{"key":"ref5","article-title":"Single- and multiple-event induced upsets in HfO2\/Hf 1T1R RRAM","volume":"61 0","author":"bennet","year":"2014","journal-title":"IEEE Transactions on Nuclear Science"},{"journal-title":"CACTI 6 5","year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2465164"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2358235"}],"event":{"name":"2019 IEEE 13th International Conference on ASIC (ASICON)","start":{"date-parts":[[2019,10,29]]},"location":"Chongqing, China","end":{"date-parts":[[2019,11,1]]}},"container-title":["2019 IEEE 13th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8963812\/8983425\/08983491.pdf?arnumber=8983491","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:23:19Z","timestamp":1756754599000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8983491\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/asicon47005.2019.8983491","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}