{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:02:11Z","timestamp":1754161331119,"version":"3.41.2"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/asicon47005.2019.8983498","type":"proceedings-article","created":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T01:04:26Z","timestamp":1581037466000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Low-Temperature-Coefficient and High-PSRR Bandgap Reference for Readout Circuit of SPAD"],"prefix":"10.1109","author":[{"given":"Xuefeng","family":"Ye","sequence":"first","affiliation":[{"name":"School of Physics and Optoelectronics, Xiangtan University,Xiangtan,China,411105"}]},{"given":"Duoduo","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Physics and Optoelectronics, Xiangtan University,Xiangtan,China,411105"}]},{"given":"Xiangliang","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Physics and Electronics, Hunan Normal University,Changsha,China,410081"}]},{"given":"Yang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Physics and Optoelectronics, Xiangtan University,Xiangtan,China,411105"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2045519"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2711923"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EDSSC.2016.7785295"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.907226"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2852802"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2409783"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1973.1050378"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2836331"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2067770"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2632072"}],"event":{"name":"2019 IEEE 13th International Conference on ASIC (ASICON)","start":{"date-parts":[[2019,10,29]]},"location":"Chongqing, China","end":{"date-parts":[[2019,11,1]]}},"container-title":["2019 IEEE 13th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8963812\/8983425\/08983498.pdf?arnumber=8983498","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,28]],"date-time":"2025-07-28T19:40:31Z","timestamp":1753731631000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8983498\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/asicon47005.2019.8983498","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}