{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:01:12Z","timestamp":1755799272653,"version":"3.44.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/asicon47005.2019.8983517","type":"proceedings-article","created":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T01:04:26Z","timestamp":1581037466000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["An Accurate and Efficient Yield Analysis for SRAM dynamic metrics Using Differential Evolution Algorithm"],"prefix":"10.1109","author":[{"given":"Liang","family":"Pang","sequence":"first","affiliation":[{"name":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096"}]},{"given":"Yifan","family":"Chai","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Southeast University,Nanjing,210096"}]},{"given":"Mengyun","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Southeast University,Nanjing,210096"}]},{"given":"Yaqing","family":"Men","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Southeast University,Nanjing,210096"}]},{"given":"Xuexiang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096"}]},{"given":"Longxing","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Electronic Science & Engineering, Southeast University,Nanjing,210096"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146928"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.267"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2013768"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2014.6742928"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838919"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544365"}],"event":{"name":"2019 IEEE 13th International Conference on ASIC (ASICON)","start":{"date-parts":[[2019,10,29]]},"location":"Chongqing, China","end":{"date-parts":[[2019,11,1]]}},"container-title":["2019 IEEE 13th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8963812\/8983425\/08983517.pdf?arnumber=8983517","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:11:15Z","timestamp":1755627075000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8983517\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/asicon47005.2019.8983517","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}