{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,11]],"date-time":"2025-09-11T18:43:37Z","timestamp":1757616217752,"version":"3.44.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/asicon47005.2019.8983536","type":"proceedings-article","created":{"date-parts":[[2020,2,7]],"date-time":"2020-02-07T01:04:26Z","timestamp":1581037466000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient"],"prefix":"10.1109","author":[{"given":"Xiaoyu","family":"Zhang","sequence":"first","affiliation":[{"name":"College of Computer, National University of Defense Technology,Changsha,Hunan,China,410073"}]},{"given":"Bin","family":"Liang","sequence":"additional","affiliation":[{"name":"College of Computer, National University of Defense Technology,Changsha,Hunan,China,410073"}]},{"given":"Ruiqiang","family":"Song","sequence":"additional","affiliation":[{"name":"College of Computer, National University of Defense Technology,Changsha,Hunan,China,410073"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2260357"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2042613"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784485"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2005981"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255313"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"year":"0","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2042613"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"}],"event":{"name":"2019 IEEE 13th International Conference on ASIC (ASICON)","start":{"date-parts":[[2019,10,29]]},"location":"Chongqing, China","end":{"date-parts":[[2019,11,1]]}},"container-title":["2019 IEEE 13th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8963812\/8983425\/08983536.pdf?arnumber=8983536","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,5]],"date-time":"2025-09-05T18:10:08Z","timestamp":1757095808000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8983536\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/asicon47005.2019.8983536","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}