{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:12:36Z","timestamp":1740100356593,"version":"3.37.3"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007302","name":"Beijing University of Chemical Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100007302","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,26]]},"DOI":"10.1109\/asicon52560.2021.9620358","type":"proceedings-article","created":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T20:53:36Z","timestamp":1638392016000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A high precision positive temperature circuit using DEM technique"],"prefix":"10.1109","author":[{"given":"Hang","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Jin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XinHang","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Duli","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kedu","family":"Han","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heming","family":"Sun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON47005.2019.8983674"},{"key":"ref3","first-page":"76","article-title":"5.3 A Highly Digital 2210?m2 Resistor-Based Temperature Sensor with a 1-Point Trimmed Inaccuracy of ±1.3°C (3?) from -55°C to 125°C in 65nm CMOS","author":"angevare","year":"0","journal-title":"2021 IEEE International Solid-State Circuits Conference-(ISSCC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2015.7516911"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2921889"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2029035"}],"event":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","start":{"date-parts":[[2021,10,26]]},"location":"Kunming, China","end":{"date-parts":[[2021,10,29]]}},"container-title":["2021 IEEE 14th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9620208\/9620199\/09620358.pdf?arnumber=9620358","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:53:38Z","timestamp":1652201618000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9620358\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,26]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/asicon52560.2021.9620358","relation":{},"subject":[],"published":{"date-parts":[[2021,10,26]]}}}