{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:12:37Z","timestamp":1740100357062,"version":"3.37.3"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,26]]},"DOI":"10.1109\/asicon52560.2021.9620392","type":"proceedings-article","created":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T20:53:36Z","timestamp":1638392016000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Fast Aging-aware Static Timing Analysis Prediction Frame of Digital Integrated Circuits"],"prefix":"10.1109","author":[{"given":"Jiahui","family":"Hu","sequence":"first","affiliation":[]},{"given":"Changhao","family":"Yan","sequence":"additional","affiliation":[]},{"given":"Chao","family":"Guo","sequence":"additional","affiliation":[]},{"given":"Ronggui","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Dian","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Xuan","family":"Zeng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref3","article-title":"Hot-electron-induced mosfet degradation-model, monitor, and improvement","author":"hu","year":"1985","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-09834-0_65"},{"key":"ref6","article-title":"Primetime® advanced ocv technology","author":"walia","year":"2009","journal-title":"Synopsys"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1109557.1109682"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2008.4672007"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10543-010-0265-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"ref9","article-title":"Static timing analysis for nanometer designs: A practical approach","author":"bhasker","year":"2009","journal-title":"Springer Science & Business Media"},{"key":"ref1","article-title":"Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits","author":"bushnell","year":"2004","journal-title":"Springer Science & Business Media"}],"event":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","start":{"date-parts":[[2021,10,26]]},"location":"Kunming, China","end":{"date-parts":[[2021,10,29]]}},"container-title":["2021 IEEE 14th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9620208\/9620199\/09620392.pdf?arnumber=9620392","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:53:34Z","timestamp":1652201614000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9620392\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,26]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/asicon52560.2021.9620392","relation":{},"subject":[],"published":{"date-parts":[[2021,10,26]]}}}