{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:12:38Z","timestamp":1740100358875,"version":"3.37.3"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,26]]},"DOI":"10.1109\/asicon52560.2021.9620404","type":"proceedings-article","created":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T20:53:36Z","timestamp":1638392016000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["A LVTSCR-Based Compact Structure for Latch-up Immune"],"prefix":"10.1109","author":[{"given":"Songyan","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaomei","family":"Fan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhihua","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yingtao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruike","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juin J.","family":"Liou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"21","author":"chatterjee","year":"1991","journal-title":"IEEE"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(97)00086-3"},{"key":"ref12","first-page":"358","author":"neamen","year":"2012","journal-title":"Materials Today"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/cryst10111059"},{"journal-title":"ESD-STM5 1-2001","year":"2001","author":"esd","key":"ref14"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/5.220901"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2009.01.001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2926103"},{"key":"ref5","first-page":"535","volume":"3","author":"blaho","year":"2004","journal-title":"IEEE International on Reliability"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1631\/jzus.2007.A1879"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.0205"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.846824"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.659493"},{"key":"ref9","first-page":"753","volume":"7","author":"liu","year":"2008","journal-title":"IEEE Electron Device Letters"}],"event":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","start":{"date-parts":[[2021,10,26]]},"location":"Kunming, China","end":{"date-parts":[[2021,10,29]]}},"container-title":["2021 IEEE 14th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9620208\/9620199\/09620404.pdf?arnumber=9620404","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:53:36Z","timestamp":1652201616000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9620404\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,26]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/asicon52560.2021.9620404","relation":{},"subject":[],"published":{"date-parts":[[2021,10,26]]}}}