{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T07:23:03Z","timestamp":1770708183257,"version":"3.49.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,26]],"date-time":"2021-10-26T00:00:00Z","timestamp":1635206400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,26]]},"DOI":"10.1109\/asicon52560.2021.9620437","type":"proceedings-article","created":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T20:53:36Z","timestamp":1638392016000},"page":"1-3","source":"Crossref","is-referenced-by-count":2,"title":["Stability Analysis of Monolithic GaN MIS-HEMT Comparator with Device PBTI and Circuit Stress Tests"],"prefix":"10.1109","author":[{"given":"Ang","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yi","family":"Shen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziqian","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuhao","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Huiqing","family":"Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wen","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"58","author":"cui","year":"2019","journal-title":"Japanese Journal of Applied Physics"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2539341"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052875"},{"key":"ref13","author":"gregoire","year":"2003","journal-title":"Google Patents"},{"key":"ref14","first-page":"1","author":"li","year":"2021","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2396649"},{"key":"ref3","first-page":"1","author":"sun","year":"2019","journal-title":"2019 International Conference on IC Design & Technology (ICICDT)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7047069"},{"key":"ref5","first-page":"7.3.1","author":"kwan","year":"2012","journal-title":"2012 International Electron Devices Meeting"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2686840"},{"key":"ref7","first-page":"1","author":"lu","year":"2019","journal-title":"2019 International Conference on IC Design & Technology (ICICDT)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2088376"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2657579"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2291854"}],"event":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","location":"Kunming, China","start":{"date-parts":[[2021,10,26]]},"end":{"date-parts":[[2021,10,29]]}},"container-title":["2021 IEEE 14th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9620208\/9620199\/09620437.pdf?arnumber=9620437","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:53:38Z","timestamp":1652201618000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9620437\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,26]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/asicon52560.2021.9620437","relation":{},"subject":[],"published":{"date-parts":[[2021,10,26]]}}}