{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T17:05:36Z","timestamp":1725728736662},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017549","name":"Science and Technology Innovation 2025 Major Project of Ningbo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017549","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007834","name":"Natural Science Foundation of Ningbo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007834","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004387","name":"Ningbo University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004387","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,24]]},"DOI":"10.1109\/asicon58565.2023.10396120","type":"proceedings-article","created":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T13:33:59Z","timestamp":1706103239000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Highly Reliable Physical Unclonable Function Based on ZnO-SnO<sub>2<\/sub> Gas Sensor"],"prefix":"10.1109","author":[{"given":"Haonan","family":"He","sequence":"first","affiliation":[{"name":"Ningbo University,Faculty of Information Science and Technology,Ningbo,China,315211"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pengjun","family":"Wang","sequence":"additional","affiliation":[{"name":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China,325035"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiangyu","family":"Li","sequence":"additional","affiliation":[{"name":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China,325035"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Ni","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Information Science and Technology,Ningbo,China,315211"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuejun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Information Science and Technology,Ningbo,China,315211"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2023 IEEE 15th International Conference on ASIC (ASICON)","start":{"date-parts":[[2023,10,24]]},"location":"Nanjing, China","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 IEEE 15th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10395907\/10395930\/10396120.pdf?arnumber=10396120","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T13:35:23Z","timestamp":1706103323000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10396120\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,24]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/asicon58565.2023.10396120","relation":{},"subject":[],"published":{"date-parts":[[2023,10,24]]}}}