{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,22]],"date-time":"2025-04-22T05:48:36Z","timestamp":1745300916188},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,24]]},"DOI":"10.1109\/asicon58565.2023.10396188","type":"proceedings-article","created":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T18:33:59Z","timestamp":1706121239000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["A Region of Interest Technique for Event Driven Typed SPAD Readout Circuit"],"prefix":"10.1109","author":[{"given":"Minwei","family":"Hu","sequence":"first","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Wuxi,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin","family":"Wu","sequence":"additional","affiliation":[{"name":"Wuxi Campus of Southeast University,Wuxi,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenggong","family":"Wan","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Wuxi,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lixia","family":"Zheng","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/12.2536352"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/12.2618282"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.2617554"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2015.7313903"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3005760"}],"event":{"name":"2023 IEEE 15th International Conference on ASIC (ASICON)","start":{"date-parts":[[2023,10,24]]},"location":"Nanjing, China","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 IEEE 15th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10395907\/10395930\/10396188.pdf?arnumber=10396188","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T07:08:10Z","timestamp":1709449690000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10396188\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,24]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/asicon58565.2023.10396188","relation":{},"subject":[],"published":{"date-parts":[[2023,10,24]]}}}