{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T12:16:27Z","timestamp":1725711387975},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,24]]},"DOI":"10.1109\/asicon58565.2023.10396594","type":"proceedings-article","created":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T18:33:59Z","timestamp":1706121239000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Low Jitter Current-Mode Multiplying Delay-Locked Loop Applied to High-Precision TDC"],"prefix":"10.1109","author":[{"given":"Jin","family":"Sun","sequence":"first","affiliation":[{"name":"Xidian University,College of Microelectronics,Xi'an,China"}]},{"given":"Jiahao","family":"Hu","sequence":"additional","affiliation":[{"name":"Xidian University,College of Microelectronics,Xi'an,China"}]},{"given":"Ziqi","family":"Song","sequence":"additional","affiliation":[{"name":"Xidian University,Wuhu Research Institute,Wuhu,China"}]},{"given":"Qing","family":"Li","sequence":"additional","affiliation":[{"name":"Xidian University,Wuhu Research Institute,Wuhu,China"}]},{"given":"Dian","family":"He","sequence":"additional","affiliation":[{"name":"Xidian University,Wuhu Research Institute,Wuhu,China"}]},{"given":"Hujun","family":"Jia","sequence":"additional","affiliation":[{"name":"Xidian University,College of Microelectronics,Xi'an,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3083545"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EUROCON.2019.8861985"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2719685"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757469"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7418039"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2688369"}],"event":{"name":"2023 IEEE 15th International Conference on ASIC (ASICON)","start":{"date-parts":[[2023,10,24]]},"location":"Nanjing, China","end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 IEEE 15th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10395907\/10395930\/10396594.pdf?arnumber=10396594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T07:47:33Z","timestamp":1706773653000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10396594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,24]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/asicon58565.2023.10396594","relation":{},"subject":[],"published":{"date-parts":[[2023,10,24]]}}}