{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:57:34Z","timestamp":1771613854293,"version":"3.50.1"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,24]],"date-time":"2023-10-24T00:00:00Z","timestamp":1698105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017549","name":"Science and Technology Innovation 2025 Major Project of Ningbo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017549","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007834","name":"Natural Science Foundation of Ningbo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007834","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004387","name":"Ningbo University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004387","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004387","name":"Ningbo University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004387","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,24]]},"DOI":"10.1109\/asicon58565.2023.10396623","type":"proceedings-article","created":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T13:33:59Z","timestamp":1706103239000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["High-Performance Rejection Sampling Hardware Circuit Design for Kyber"],"prefix":"10.1109","author":[{"given":"Yang","family":"Wang","sequence":"first","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]},{"given":"Huihong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]},{"given":"Yuejun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]},{"given":"Hongshuai","family":"Wei","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]},{"given":"Pengjun","family":"Wang","sequence":"additional","affiliation":[{"name":"Wenzhou University,College of Electrical and Electronic Engineering,Wenzhou,China,325035"}]},{"given":"Tengfei","family":"Yuan","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]},{"given":"Chengjie","family":"Wang","sequence":"additional","affiliation":[{"name":"Ningbo University,Faculty of Electrical Engineering and Computer Science,Ningbo,China,315211"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EuroSP.2018.00032"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3230359"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401170"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2983185"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3103184"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3162593"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3219555"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2022.3222954"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i4.17-61"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3106639"}],"event":{"name":"2023 IEEE 15th International Conference on ASIC (ASICON)","location":"Nanjing, China","start":{"date-parts":[[2023,10,24]]},"end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 IEEE 15th International Conference on ASIC (ASICON)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10395907\/10395930\/10396623.pdf?arnumber=10396623","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T17:36:49Z","timestamp":1760463409000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10396623\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,24]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/asicon58565.2023.10396623","relation":{},"subject":[],"published":{"date-parts":[[2023,10,24]]}}}