{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T16:37:50Z","timestamp":1773247070602,"version":"3.50.1"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/asp-dac47756.2020.9045161","type":"proceedings-article","created":{"date-parts":[[2020,3,27]],"date-time":"2020-03-27T12:27:10Z","timestamp":1585312030000},"page":"617-622","source":"Crossref","is-referenced-by-count":11,"title":["Soft Error and Its Countermeasures in Terrestrial Environment"],"prefix":"10.1109","author":[{"given":"Masanori","family":"Hashimoto","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wang","family":"Liao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","article-title":"When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies","author":"yan","year":"0","journal-title":"Proc ASP-DAC"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2825469"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0160390"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0144679"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.321010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093181"},{"key":"ref15","first-page":"212t","article-title":"Ultralow-voltage operation of Silicon-on-Thin-BOX(SOTB) 2Mbit SRAM down to 0.37 V utilizing adaptive back bias","author":"yamamoto","year":"2013","journal-title":"Proc Symposium on VLSI Circuits"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/SISPAD.2017.8085281"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2015312"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105388"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.19"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E97.A.2518"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.03.005"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2228015"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1587\/transele.2018CDP0004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1984.4333479"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253806"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2016.8093141"},{"key":"ref8","article-title":"Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs","author":"liao","year":"2019","journal-title":"Proc IRPS"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2080689"},{"key":"ref2","author":"ibe","year":"2015","journal-title":"Terrestrial Radiation Effects in ULSI Devices and Electronic Systems"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2839704"},{"key":"ref1","year":"2018","journal-title":"IoT trend watch 2018"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2495130"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2823786"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173251"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2444855"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2878387"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2284650"},{"key":"ref25","article-title":"Characterizing Neutron-Induced SDC Rate of Matrix Multiplication in Tesla P4 GPU","author":"ito","year":"2019","journal-title":"Proc RADECS"}],"event":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","location":"Beijing, China","start":{"date-parts":[[2020,1,13]]},"end":{"date-parts":[[2020,1,16]]}},"container-title":["2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9036752\/9045099\/09045161.pdf?arnumber=9045161","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:45:24Z","timestamp":1656344724000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9045161\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/asp-dac47756.2020.9045161","relation":{},"subject":[],"published":{"date-parts":[[2020,1]]}}}