{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T00:03:15Z","timestamp":1768348995733,"version":"3.49.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/asp-dac47756.2020.9045415","type":"proceedings-article","created":{"date-parts":[[2020,3,27]],"date-time":"2020-03-27T12:27:10Z","timestamp":1585312030000},"page":"637-644","source":"Crossref","is-referenced-by-count":20,"title":["NCFET to Rescue Technology Scaling: Opportunities and Challenges"],"prefix":"10.1109","author":[{"given":"Hussam","family":"Amrouch","sequence":"first","affiliation":[]},{"given":"Victor M.","family":"van Santen","sequence":"additional","affiliation":[]},{"given":"Girish","family":"Pahwa","sequence":"additional","affiliation":[]},{"given":"Yogesh","family":"Chauhan","sequence":"additional","affiliation":[]},{"given":"Jorg","family":"Henkel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Impact of NBTI Aging on Self-Heating in Nanowire FET","author":"prakash","year":"2020","journal-title":"DATE"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2875813"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2019.2916869"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317880"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2019.8824802"},{"key":"ref15","first-page":"1","article-title":"Energy optimization in ncfet-based processors","author":"salamin","year":"2020","journal-title":"2020 Design Automation & Test in Europe (DATE)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2614436"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71752-4_3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-34591-6_1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268396"},{"key":"ref3","first-page":"22","article-title":"Sub-60mv-swing negative-capacitance finfet without hysteresis","author":"li","year":"2015","journal-title":"2015 IEEE International Electron Device Meeting (IEDM)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838400"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2870916"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/nl302049k"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614521"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1021\/nl071804g","article-title":"Use of negative capacitance to provide voltage amplification for low power nanoscale devices","volume":"8","author":"salahuddin","year":"2008","journal-title":"Nano Letters"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"15.1.1","DOI":"10.1109\/IEDM.2017.8268393","article-title":"14nm ferroelectric FinFET technology with steep subthreshold slope for ultra low power applications","author":"krivokapic","year":"2017","journal-title":"IEEE International Electron Devices Meeting (IEDM)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614510"}],"event":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","location":"Beijing, China","start":{"date-parts":[[2020,1,13]]},"end":{"date-parts":[[2020,1,16]]}},"container-title":["2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9036752\/9045099\/09045415.pdf?arnumber=9045415","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:39:50Z","timestamp":1656344390000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9045415\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/asp-dac47756.2020.9045415","relation":{},"subject":[],"published":{"date-parts":[[2020,1]]}}}