{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T21:22:22Z","timestamp":1773264142689,"version":"3.50.1"},"reference-count":32,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T00:00:00Z","timestamp":1768780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T00:00:00Z","timestamp":1768780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,1,19]]},"DOI":"10.1109\/asp-dac66049.2026.11420656","type":"proceedings-article","created":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T19:51:15Z","timestamp":1773172275000},"page":"625-631","source":"Crossref","is-referenced-by-count":0,"title":["Beyond Labels: Data-Efficient Wafer Yield Prediction with TabESA"],"prefix":"10.1109","author":[{"given":"Pang","family":"Guo","sequence":"first","affiliation":[{"name":"Zhejiang University,College of Integrated Circuits,Zhejiang,China"}]},{"given":"Yining","family":"Chen","sequence":"additional","affiliation":[{"name":"Zhejiang University,College of Integrated Circuits,Zhejiang,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323689"},{"key":"ref2","first-page":"36:1","article-title":"Beyond the yield barrier: Variational importance sampling yield analysis","volume-title":"Proceedings of the 43rd IEEE\/ACM International Conference on Computer-Aided Design, ICCAD 2024","author":"Liu"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2929765"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s43684-022-00041-3"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICDE55515.2023.00378"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2016.2574130"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3117576"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2009.5155961"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2015.1109153"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSM55802.2022.10027006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2023.3238555"},{"key":"ref12","first-page":"11033","article-title":"Vime: Extending the success of self- and semi-supervised learning to tabular domain","volume":"33","author":"Yoon","year":"2020","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01269"},{"key":"ref14","article-title":"Temporal ensembling for semi-supervised learning","volume":"abs\/1610.02242","author":"Laine","year":"2016","journal-title":"ArXiv"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3511808.3557699"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1145\/3649329.3655939","article-title":"Minimizing labeling, maximizing performance: A novel approach to nanoscale scanning electron microscope (sem) defect segmentation","volume-title":"Proceedings of the 61st ACM\/IEEE Design Automation Conference, DAC \u201824","author":"Qiao"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3508352.3549476"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISAM.2009.5376916"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2009.5155961"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3055433"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s43684-022-00041-3"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2024.109905"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.04.070"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3162268"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/AIAC63745.2024.10899729"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3117576"},{"key":"ref27","first-page":"18932","article-title":"Revisiting deep learning models for tabular data","volume":"34","author":"Gorishniy","year":"2021","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref28","article-title":"Freematch: Self adaptive thresholding for semi-supervised learning","volume-title":"The Eleventh International Conference on Learning Representations","author":"Wang"},{"key":"ref29","article-title":"Temporal ensembling for semi-supervised learning","volume-title":"5th International Conference on Learning Representations","author":"Laine"},{"key":"ref30","article-title":"Saint: Improved neural networks for tabular data via row attention and contrastive pre-training","author":"Somepalli","year":"2021","journal-title":"arXiv preprint arXiv:2106.01342"},{"key":"ref31","article-title":"Scarf: Self-supervised contrastive learning using random feature corruption","volume-title":"International Conference on Learning Representations","author":"Bahri"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v35i8.16826"}],"event":{"name":"2026 31st Asia and South Pacific Design Automation Conference (ASP-DAC)","location":"Lantau, Hong Kong","start":{"date-parts":[[2026,1,19]]},"end":{"date-parts":[[2026,1,22]]}},"container-title":["2026 31st Asia and South Pacific Design Automation Conference (ASP-DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11420221\/11420229\/11420656.pdf?arnumber=11420656","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T05:21:59Z","timestamp":1773206519000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11420656\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1,19]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/asp-dac66049.2026.11420656","relation":{},"subject":[],"published":{"date-parts":[[2026,1,19]]}}}