{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T06:05:13Z","timestamp":1764828313964},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/aspdac.2006.1594659","type":"proceedings-article","created":{"date-parts":[[2006,3,22]],"date-time":"2006-03-22T17:38:08Z","timestamp":1143049088000},"page":"106-107","source":"Crossref","is-referenced-by-count":1,"title":["A built-in power supply noise probe for digital LSIs"],"prefix":"10.1109","author":[{"given":"M.","family":"Fukazawa","sequence":"first","affiliation":[]},{"given":"K.","family":"Noguchi","sequence":"additional","affiliation":[]},{"given":"M.","family":"Nagata","sequence":"additional","affiliation":[]},{"given":"K.","family":"Taki","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845559"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e88-c.4.589"}],"event":{"name":"Asia and South Pacific Conference on Design Automation, 2006.","location":"Yokohama, Japan"},"container-title":["Asia and South Pacific Conference on Design Automation, 2006."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10626\/33561\/01594659.pdf?arnumber=1594659","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:56:20Z","timestamp":1489521380000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1594659\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2006.1594659","relation":{},"subject":[]}}