{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T08:20:33Z","timestamp":1725524433036},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/aspdac.2006.1594710","type":"proceedings-article","created":{"date-parts":[[2006,3,22]],"date-time":"2006-03-22T17:38:08Z","timestamp":1143049088000},"page":"366-371","source":"Crossref","is-referenced-by-count":0,"title":["IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults"],"prefix":"10.1109","author":[{"family":"Katherine Shu-Min Li","sequence":"first","affiliation":[]},{"family":"Yao-Wen Chang","sequence":"additional","affiliation":[]},{"family":"Chauchin Su","sequence":"additional","affiliation":[]},{"family":"Chung-Len Lee","sequence":"additional","affiliation":[]},{"given":"J.E.","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.223950"},{"journal-title":"International Technology Roadmap for Semiconductors 2003 Edition (ITRS)","year":"2003","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510896"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197647"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.159992"},{"key":"6","first-page":"71","article-title":"Maximal diagnosis for wiring networks","author":"lien","year":"1991","journal-title":"Proc ITC"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.826200"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/290833.290848"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1994.408763"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1188257"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120800"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271086"}],"event":{"name":"Asia and South Pacific Conference on Design Automation, 2006.","location":"Yokohama, Japan"},"container-title":["Asia and South Pacific Conference on Design Automation, 2006."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10626\/33561\/01594710.pdf?arnumber=1594710","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T05:01:42Z","timestamp":1489554102000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1594710\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2006.1594710","relation":{},"subject":[]}}