{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:29:23Z","timestamp":1725391763389},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/aspdac.2006.1594772","type":"proceedings-article","created":{"date-parts":[[2006,3,22]],"date-time":"2006-03-22T17:38:08Z","timestamp":1143049088000},"page":"724-729","source":"Crossref","is-referenced-by-count":0,"title":["A probabilistic analysis of pipelined global interconnect under process variations"],"prefix":"10.1109","author":[{"given":"N.","family":"Kankani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Agarwal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"152","article-title":"Methodologies and tools for pipelined on-chip interconnect","author":"scheffer","year":"2002","journal-title":"Proc of International Conference on Computer Design"},{"journal-title":"International Technology Roadmap for Semiconductors","article-title":"Semiconductor industry association","year":"2004","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996806"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/332357.332383"},{"journal-title":"Design and Analysis of Experiments","year":"1997","author":"montgomery","key":"7"},{"key":"6","article-title":"Application of the probabilistic collocation method for an uncertainty analysis of a simple ocean modeltesting multivariate uniformity and its applications","author":"webster","year":"1996","journal-title":"MIT Joint Program on the Science and Policy of Global Change"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382698"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/640000.640040"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.31"},{"journal-title":"Experimental Designs 2nd Ed","year":"1957","author":"cochran","key":"8"},{"journal-title":"Berkeley Ptm-interconnect","year":"0","key":"11"}],"event":{"name":"Asia and South Pacific Conference on Design Automation, 2006.","location":"Yokohama, Japan"},"container-title":["Asia and South Pacific Conference on Design Automation, 2006."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10626\/33561\/01594772.pdf?arnumber=1594772","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:57:49Z","timestamp":1489521469000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1594772\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2006.1594772","relation":{},"subject":[]}}