{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T15:39:10Z","timestamp":1725550750084},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,1]]},"DOI":"10.1109\/aspdac.2008.4483917","type":"proceedings-article","created":{"date-parts":[[2008,4,10]],"date-time":"2008-04-10T14:56:31Z","timestamp":1207839391000},"page":"107-108","source":"Crossref","is-referenced-by-count":2,"title":["Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification"],"prefix":"10.1109","author":[{"family":"Yasuhiro Ogasahara","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Masanori Hashimoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Takao Onoye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2004.1346516"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.825120"},{"key":"1","first-page":"182","article-title":"an on-chip 100ghz-sampling rate 8-channel sampling oscilloscope with embedded sampling clock generator","author":"takamiya","year":"2002","journal-title":"Proc ISSCC"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320990"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705312"},{"year":"0","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845559"}],"event":{"name":"2008 Asia and South Pacific Design Automation Conference (ASPDAC)","start":{"date-parts":[[2008,3,21]]},"location":"Seoul, South Korea","end":{"date-parts":[[2008,3,24]]}},"container-title":["2008 Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4480121\/4483913\/04483917.pdf?arnumber=4483917","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:48:12Z","timestamp":1489686492000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4483917\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2008.4483917","relation":{},"subject":[],"published":{"date-parts":[[2008,1]]}}}