{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T20:59:49Z","timestamp":1725483589905},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,1]]},"DOI":"10.1109\/aspdac.2008.4484028","type":"proceedings-article","created":{"date-parts":[[2008,4,10]],"date-time":"2008-04-10T18:56:31Z","timestamp":1207853791000},"page":"629-634","source":"Crossref","is-referenced-by-count":0,"title":["Statistical mixed V<inf>t<\/inf> allocation of body-biased circuits for reduced leakage variation"],"prefix":"10.1109","author":[{"family":"Jinseob Jeong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Seungwhun Paik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Youngsoo Shin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","article-title":"sis: a system for sequential circuit synthesis","author":"sentovich","year":"1992","journal-title":"Tech Rep UCB\/ERL"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379043"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.1999.799444"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"journal-title":"Design for Manufacturability and Yield for Nano-Scale CMOS","year":"2007","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373605"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1996.542322"},{"key":"7","first-page":"773","article-title":"Statistical optimization of leakage power considering process variations using dual-Vth and sizing","author":"srivastava","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167561"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012674"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/92.748196"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609268"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803949"}],"event":{"name":"2008 Asia and South Pacific Design Automation Conference (ASPDAC)","start":{"date-parts":[[2008,3,21]]},"location":"Seoul, South Korea","end":{"date-parts":[[2008,3,24]]}},"container-title":["2008 Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4480121\/4483913\/04484028.pdf?arnumber=4484028","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:47:26Z","timestamp":1489700846000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4484028\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2008.4484028","relation":{},"subject":[],"published":{"date-parts":[[2008,1]]}}}