{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,29]],"date-time":"2025-05-29T05:02:46Z","timestamp":1748494966879},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,1]]},"DOI":"10.1109\/aspdac.2011.5722279","type":"proceedings-article","created":{"date-parts":[[2011,3,5]],"date-time":"2011-03-05T07:54:28Z","timestamp":1299311668000},"page":"713-718","source":"Crossref","is-referenced-by-count":7,"title":["A self-testing and calibration method for embedded successive approximation register ADC"],"prefix":"10.1109","author":[{"family":"Xuan-Lun Huang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ping-Ying Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hsiu-Ming Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jiun-Lang Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yung-Fa Chou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yung-Pin Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ding-Ming Kwai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Cheng-Wen Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1975.1050629"},{"key":"ref3","first-page":"82","article-title":"A 600MS\/s 30mW 0.13gm CMOS ADC array achieving over 60dB SFDR with adaptive digital equalization","author":"liu","year":"0"},{"journal-title":"Analog Design for CMOS VLSI Systems","year":"2001","author":"maloberti","key":"ref6"},{"journal-title":"An Introduction to Mixed-Signal IC Test and Measurement","year":"2000","author":"burns","key":"ref5"},{"key":"ref8","first-page":"1","article-title":"Calibrating capacitor mismatch and comparator for 1-bit\/stage pipelined ADCs","author":"huang","year":"2008","journal-title":"IEEE Mixed-Signal Sensors and Systems Test Workshop"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469548"},{"key":"ref2","first-page":"218","article-title":"Test time reduction of successive approximation register AID converter by selective code measurement","author":"goyal","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/343647.343762"}],"event":{"name":"2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011","start":{"date-parts":[[2011,1,25]]},"location":"Yokohama","end":{"date-parts":[[2011,1,28]]}},"container-title":["16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5716646\/5722157\/05722279.pdf?arnumber=5722279","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T02:55:53Z","timestamp":1490064953000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5722279\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,1]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2011.5722279","relation":{},"subject":[],"published":{"date-parts":[[2011,1]]}}}