{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:48:48Z","timestamp":1764841728582,"version":"3.40.4"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,1]]},"DOI":"10.1109\/aspdac.2013.6509582","type":"proceedings-article","created":{"date-parts":[[2013,5,3]],"date-time":"2013-05-03T23:36:53Z","timestamp":1367624213000},"page":"113-118","source":"Crossref","is-referenced-by-count":20,"title":["Thermal management for dependable on-chip systems"],"prefix":"10.1109","author":[{"given":"J.","family":"Henkel","sequence":"first","affiliation":[]},{"given":"T.","family":"Ebi","sequence":"additional","affiliation":[]},{"given":"H.","family":"Amrouch","sequence":"additional","affiliation":[]},{"given":"H.","family":"Khdr","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"22","first-page":"139","author":"velamala","year":"2012","journal-title":"Physics Matters Statistical Aging Prediction under Trapping\/detrapping"},{"key":"17","first-page":"619","article-title":"Effect of thermal gradients on the electromigration life-time in power electronics","author":"nguyen","year":"2004","journal-title":"Reliability Physics Symposium Proceedings 42nd Annual IEEE International"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2010.5450548"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2002.993068"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2006.31"},{"key":"13","article-title":"An improved block-based thermal model in hotspot 40","author":"huang","year":"2007","journal-title":"With Granularity Considerations"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2067810"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11515-8_17"},{"key":"12","first-page":"51","article-title":"Lifetime reliability-aware task allocation and scheduling for mpsoc platforms","author":"huang","year":"2009","journal-title":"Proc Design Automation Test Europe Conf Exhibition"},{"key":"21","doi-asserted-by":"crossref","first-page":"276","DOI":"10.1145\/1028176.1006725","article-title":"Rivers. The case for lifetime reliability-aware microprocessors","author":"srinivasan","year":"2004","journal-title":"SIGARCH Comput Archit News"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1063\/1.338954"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"year":"0","key":"1"},{"key":"10","doi-asserted-by":"crossref","DOI":"10.26636\/jtit.2007.2.813","article-title":"Energy concepts involved in mos characterization","author":"engstrom","year":"2007","journal-title":"Journal of Telecommunication and Information Technology"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2008.4484002"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555369"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391693"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.68"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/2380445.2380488"},{"key":"8","article-title":"Sim-alpha: A validated","author":"doug","year":"2001","journal-title":"Execution-driven Alpha 21264 Simulator"}],"event":{"name":"2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC 2013)","start":{"date-parts":[[2013,1,22]]},"location":"Yokohama","end":{"date-parts":[[2013,1,25]]}},"container-title":["2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6507004\/6509548\/06509582.pdf?arnumber=6509582","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,30]],"date-time":"2025-04-30T08:33:11Z","timestamp":1746001991000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6509582\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,1]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2013.6509582","relation":{},"subject":[],"published":{"date-parts":[[2013,1]]}}}