{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T10:16:10Z","timestamp":1769163370259,"version":"3.49.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/aspdac.2015.7058990","type":"proceedings-article","created":{"date-parts":[[2015,3,13]],"date-time":"2015-03-13T21:06:37Z","timestamp":1426280797000},"page":"112-117","source":"Crossref","is-referenced-by-count":6,"title":["Modeling framework for cross-point resistive memory design emphasizing reliability and variability issues"],"prefix":"10.1109","author":[{"family":"Yang Zheng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cong","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuan","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703410"},{"key":"ref12","first-page":"19.7.1","article-title":"Evidence and solution of over-reset problem for hfox based resistive memory with sub-ns switching speed and high endurance","author":"lee","year":"2010","journal-title":"International Electron Devices Meeting (IEDM)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210856"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201203680"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131539"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722206"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2333660.2333712"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2007.4430310"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2007.4339742"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419061"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746281"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2184545"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724599"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.20"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746286"}],"event":{"name":"2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC)","location":"Chiba, Japan","start":{"date-parts":[[2015,1,19]]},"end":{"date-parts":[[2015,1,22]]}},"container-title":["The 20th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7050531\/7058915\/07058990.pdf?arnumber=7058990","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T18:21:25Z","timestamp":1490379685000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7058990\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2015.7058990","relation":{},"subject":[],"published":{"date-parts":[[2015,1]]}}}