{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:12:01Z","timestamp":1725703921177},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/aspdac.2015.7059011","type":"proceedings-article","created":{"date-parts":[[2015,3,13]],"date-time":"2015-03-13T21:06:37Z","timestamp":1426280797000},"page":"237-242","source":"Crossref","is-referenced-by-count":1,"title":["Design methodology for approximate accumulator based on statistical error model"],"prefix":"10.1109","author":[{"given":"Chang","family":"Liu","sequence":"first","affiliation":[]},{"given":"Xinghua","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Fei","family":"Qiao","sequence":"additional","affiliation":[]},{"family":"Qi Wei","sequence":"additional","affiliation":[]},{"given":"Huazhong","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2208966"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2126573"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"199","DOI":"10.1109\/ICCAD.2007.4397266","article-title":"Design methodology to trade off power, output quality and error resiliency: application to color interpolation filtering","author":"karakonstantis","year":"2007","journal-title":"Proceedings of the 2007 IEEE\/ACM international conference on Computer-aided design"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1840845.1840871"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105401"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228450"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691108"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2540708.2540711"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228504"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PATMOS.2013.6662164"},{"key":"ref8","article-title":"Analytic error modeling for imprecise arithmetic circuits","author":"huang","year":"2011","journal-title":"Proc SELSE"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837411"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2217962"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803941"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657024"}],"event":{"name":"2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC)","start":{"date-parts":[[2015,1,19]]},"location":"Chiba, Japan","end":{"date-parts":[[2015,1,22]]}},"container-title":["The 20th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7050531\/7058915\/07059011.pdf?arnumber=7059011","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T07:20:02Z","timestamp":1498202402000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7059011\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2015.7059011","relation":{},"subject":[],"published":{"date-parts":[[2015,1]]}}}