{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:48:33Z","timestamp":1730198913360,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/aspdac.2015.7059098","type":"proceedings-article","created":{"date-parts":[[2015,3,13]],"date-time":"2015-03-13T21:06:37Z","timestamp":1426280797000},"page":"737-742","source":"Crossref","is-referenced-by-count":5,"title":["On test syndrome merging for reasoning-based board-level functional fault diagnosis"],"prefix":"10.1109","author":[{"given":"Zelong","family":"Sun","sequence":"first","affiliation":[]},{"given":"Li","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Qiang","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Zhaobo","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Zhiyuan","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.748164"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0952-1976(95)00012-P"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2005.159"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1021\/ci0342472"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809071"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139139"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355715"},{"key":"ref8","first-page":"27","article-title":"Conditional likelihood maximisation: A unifying framework for information theoretic feature selection","volume":"13","author":"brown","year":"2012","journal-title":"The Journal of Machine Learning Research"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569364"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651918"},{"key":"ref1","first-page":"181","article-title":"Defect coverage of boundary-scan tests: what does it mean when a boundary-scan test passes?","author":"parker","year":"2003","journal-title":"Proc IEEE International Test Conference (ITC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233029"}],"event":{"name":"2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC)","start":{"date-parts":[[2015,1,19]]},"location":"Chiba, Japan","end":{"date-parts":[[2015,1,22]]}},"container-title":["The 20th Asia and South Pacific Design Automation Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7050531\/7058915\/07059098.pdf?arnumber=7059098","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T18:01:47Z","timestamp":1490378507000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7059098\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2015.7059098","relation":{},"subject":[],"published":{"date-parts":[[2015,1]]}}}