{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T08:13:28Z","timestamp":1759133608361},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,1]]},"DOI":"10.1109\/aspdac.2016.7428091","type":"proceedings-article","created":{"date-parts":[[2016,3,10]],"date-time":"2016-03-10T16:48:08Z","timestamp":1457628488000},"page":"685-690","source":"Crossref","is-referenced-by-count":20,"title":["Balancing lifetime and soft-error reliability to improve system availability"],"prefix":"10.1109","author":[{"given":"Junlong","family":"Zhou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"X. Sharon","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tongquan","family":"Wei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1816023"},{"key":"ref12","first-page":"1","article-title":"FARM fault-aware resource management in NoC","author":"chou","year":"2011","journal-title":"Proc Conf Design Autom Test Europe"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2039370.2039409"},{"key":"ref14","first-page":"1","article-title":"Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs","author":"das","year":"2014","journal-title":"Proc Conf Design Autom Test Europe"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555369"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1878961.1879013"},{"key":"ref17","article-title":"System software reliability","author":"pham","year":"2007","journal-title":"Springer-Verlag London"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1145\/2742060.2742113","article-title":"Improving lifetime of multicore soft realtime systems through global utilization control","author":"ma","year":"2015","journal-title":"Proc Great Lakes Symp VLSI"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MASCOT.2009.5363142"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.818148"},{"journal-title":"Joint Electron Device Engineering Council Tech Rep JEP 122-B","article-title":"Failure mechanisms and models for semiconductor devices","year":"2003","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2011.132"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001394"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0450"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.281"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.28"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311888"},{"key":"ref9","first-page":"35","article-title":"The effects of energy management on reliability in real-time embedded systems","author":"zhu","year":"2004","journal-title":"Proc Int Conf Comput Aided Design"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2442087.2442094"},{"journal-title":"HotSpot 5 0 University of Virginia","year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2010.2052057"},{"journal-title":"E3S Available","year":"2013","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2010.2051970"}],"event":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","start":{"date-parts":[[2016,1,25]]},"location":"Macao, Macao","end":{"date-parts":[[2016,1,28]]}},"container-title":["2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7422345\/7427971\/7428091.pdf?arnumber=7428091","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,5]],"date-time":"2019-09-05T08:07:10Z","timestamp":1567670830000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7428091\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/aspdac.2016.7428091","relation":{},"subject":[],"published":{"date-parts":[[2016,1]]}}}