{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T10:11:43Z","timestamp":1778667103137,"version":"3.51.4"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,11]]},"DOI":"10.1109\/asscc.2011.6123608","type":"proceedings-article","created":{"date-parts":[[2012,1,27]],"date-time":"2012-01-27T23:08:00Z","timestamp":1327705680000},"page":"77-80","source":"Crossref","is-referenced-by-count":6,"title":["Digital-domain calibration of split-capacitor DAC with no extra calibration DAC for a differential-type SAR ADC"],"prefix":"10.1109","author":[{"given":"Ji-Yong","family":"Um","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Hwan","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Yoon","family":"Sim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong-June","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2102590"},{"key":"2","article-title":"A 9.4-ENOB 1V 3.8mW 100kS\/s SAR ADC with time-domain comparator","author":"agnes","year":"2008","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2014707"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.261994"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.173093"},{"key":"5","article-title":"A 10b 50 MS\/s 820mW SAR ADC with on-chip digital calibration","author":"yoshioka","year":"2010","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2009.5280859"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052231"}],"event":{"name":"2011 IEEE Asian Solid-State Circuits Conference (A-SSCC)","location":"Jeju, South Korea","start":{"date-parts":[[2011,11,14]]},"end":{"date-parts":[[2011,11,16]]}},"container-title":["IEEE Asian Solid-State Circuits Conference 2011"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6118260\/6123555\/06123608.pdf?arnumber=6123608","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T16:52:18Z","timestamp":1490115138000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6123608\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,11]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/asscc.2011.6123608","relation":{},"subject":[],"published":{"date-parts":[[2011,11]]}}}