{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,25]],"date-time":"2025-10-25T12:22:45Z","timestamp":1761394965152},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11]]},"DOI":"10.1109\/asscc.2016.7844137","type":"proceedings-article","created":{"date-parts":[[2017,2,10]],"date-time":"2017-02-10T10:58:46Z","timestamp":1486724326000},"page":"69-72","source":"Crossref","is-referenced-by-count":8,"title":["An 8-bit 1.25GS\/s CMOS IF-sampling ADC with background calibration for dynamic distortion"],"prefix":"10.1109","author":[{"given":"Si","family":"Chen","sequence":"first","affiliation":[]},{"given":"Boris","family":"Murmann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2315624"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SIPS.2010.5624782"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2361339"},{"key":"ref5","first-page":"92","article-title":"A 5. 4GS\/s 12b 500mW Pipeline ADC in 28nm CMOS","author":"wu","year":"2013","journal-title":"Symp VLSI Circuits Dig"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2013.6649086"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2013.6487817"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2009.2020575"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RADAR.2016.7485175"}],"event":{"name":"2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)","start":{"date-parts":[[2016,11,7]]},"location":"Toyama, Japan","end":{"date-parts":[[2016,11,9]]}},"container-title":["2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7833314\/7844119\/07844137.pdf?arnumber=7844137","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T17:56:31Z","timestamp":1488390991000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7844137\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/asscc.2016.7844137","relation":{},"subject":[],"published":{"date-parts":[[2016,11]]}}}