{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:14:04Z","timestamp":1761581644708},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/asscc.2017.8240216","type":"proceedings-article","created":{"date-parts":[[2017,12,28]],"date-time":"2017-12-28T16:32:34Z","timestamp":1514478754000},"page":"61-64","source":"Crossref","is-referenced-by-count":5,"title":["25 fJ\/bit, 5Mb\/s, 0.3 V true random number generator with capacitively-coupled chaos system and dual-edge sampling scheme"],"prefix":"10.1109","author":[{"given":"Anh Tuan","family":"Do","sequence":"first","affiliation":[]},{"given":"Xin","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"203","article-title":"2.4GHz 7mW all-digital PVT-variation tolerant True Random Number Generator in 45nm CMOS","author":"srinivasan","year":"2010","journal-title":"VLSI Circuits Symp"},{"key":"ref3","first-page":"414","article-title":"1200 ?m2 Physical Random-Number Generators Based on SiN MOSFET for Secure Smart-Card Application","author":"matsumoto","year":"0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1190581"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757434"},{"year":"0","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7418022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855588"}],"event":{"name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","start":{"date-parts":[[2017,11,6]]},"location":"Seoul","end":{"date-parts":[[2017,11,8]]}},"container-title":["2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8226344\/8240197\/08240216.pdf?arnumber=8240216","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,5]],"date-time":"2018-02-05T17:34:41Z","timestamp":1517852081000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8240216\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/asscc.2017.8240216","relation":{},"subject":[],"published":{"date-parts":[[2017,11]]}}}