{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:50:37Z","timestamp":1730199037558,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/asscc.2017.8240228","type":"proceedings-article","created":{"date-parts":[[2017,12,28]],"date-time":"2017-12-28T21:32:34Z","timestamp":1514496754000},"page":"109-112","source":"Crossref","is-referenced-by-count":2,"title":["On-chip spur and phase noise cancellation techniques"],"prefix":"10.1109","author":[{"given":"Yi-An","family":"Li","sequence":"first","affiliation":[]},{"given":"Monte","family":"Mar","sequence":"additional","affiliation":[]},{"given":"Borivoje","family":"Nikolic","sequence":"additional","affiliation":[]},{"given":"Ali M.","family":"Niknejad","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2012.6242257"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2416239"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2016.7540343"},{"key":"ref5","first-page":"63","article-title":"A 10 GHz delay line frequency discriminator and PD\/CP based CMOS phase noise measurement circuit with ?138.6 dBc\/Hz sensitivity at 1 MHz offset","author":"hao","year":"2015","journal-title":"IEEE RFIC"},{"journal-title":"The art of phase noise measurement","year":"0","author":"scherer","key":"ref2"},{"key":"ref1","article-title":"Design methodology and architectures to reduce the semiconductor laser phase noise using electrical feed-forward schemes","volume":"58","author":"aflatouni","year":"2010","journal-title":"IEEE TMTT"}],"event":{"name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","start":{"date-parts":[[2017,11,6]]},"location":"Seoul","end":{"date-parts":[[2017,11,8]]}},"container-title":["2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8226344\/8240197\/08240228.pdf?arnumber=8240228","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T22:39:06Z","timestamp":1643150346000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8240228\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/asscc.2017.8240228","relation":{},"subject":[],"published":{"date-parts":[[2017,11]]}}}