{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T09:19:04Z","timestamp":1742807944517,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.2002.1181680","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T11:35:00Z","timestamp":1056627300000},"page":"27-32","source":"Crossref","is-referenced-by-count":0,"title":["A totally self-checking dynamic asynchronous datapath"],"prefix":"10.1109","author":[{"family":"Jing-ling Yang","sequence":"first","affiliation":[]},{"family":"Chiu-sing Choy","sequence":"additional","affiliation":[]},{"family":"Cheong-fat Chan","sequence":"additional","affiliation":[]},{"family":"Kong-pong Pun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Detecting Exitory Stock-at Faults in Semimodular Asynchronous Circuits","volume":"48","author":"liebsit","year":"1999","journal-title":"IEEE Transaction on Computers"},{"article-title":"Self-timed Control of Concurrent Processes","year":"1990","author":"varshavky","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315653"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.102679"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.98986"},{"key":"ref7","article-title":"A Self-Timed Divider Using a New Fast and Robust Pipeline Scheme","volume":"36","author":"yang","year":"2001","journal-title":"IEEE Journal of Solid State Circuits"},{"key":"ref2","article-title":"Semi-Modularity and Testability of speed-independent Circuits","volume":"13","author":"becrel","year":"1992","journal-title":"INTEGRATION the VLSIjournal"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.1997.587175"},{"article-title":"Error Detecting Codes Self-Checking Circuits and Applications","year":"1978","author":"wakerly","key":"ref1"}],"event":{"name":"Eleventh Asian Test Symposium","acronym":"ATS-02","location":"Guam, USA"},"container-title":["Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8413\/26519\/01181680.pdf?arnumber=1181680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T20:32:06Z","timestamp":1489437126000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1181680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ats.2002.1181680","relation":{},"subject":[]}}