{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:10:39Z","timestamp":1729663839621,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.2002.1181713","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T15:35:00Z","timestamp":1056641700000},"page":"212-217","source":"Crossref","is-referenced-by-count":0,"title":["A fault-tolerant architecture for symmetric block ciphers"],"prefix":"10.1109","author":[{"family":"Min-Kyu Joo","sequence":"first","affiliation":[]},{"family":"Jin-Hyung Kim","sequence":"additional","affiliation":[]},{"family":"Yoon-Hwa Choi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379027"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470624"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1982.49"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1201\/9781439821916","author":"menezes","year":"1996","journal-title":"Handbook of Applied Cryptography"},{"key":"ref11","first-page":"74","article-title":"Fault-tolerant and two-level pipelining in VLSI systolic arrays","author":"kung","year":"1984","journal-title":"Proc MIT Conf Advanced Res VLSI"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966796"},{"journal-title":"Error Detecting Codes Self-Checking Circuits and Applications","year":"1978","author":"wakerly","key":"ref12"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"513","DOI":"10.1007\/BFb0052259","article-title":"Differential fault analysis of secret key cryptosystems","volume":"1294","author":"biham","year":"1997","journal-title":"Advanced in Cryptology Proc Crypto'97 Lecture notes in Computer Science"},{"article-title":"AES proposal: Rijndael","year":"0","author":"daemen","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894310"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S1389-1286(01)00164-5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1995.521534"}],"event":{"name":"Eleventh Asian Test Symposium","acronym":"ATS-02","location":"Guam, USA"},"container-title":["Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8413\/26519\/01181713.pdf?arnumber=1181713","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:46:27Z","timestamp":1497566787000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1181713\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ats.2002.1181713","relation":{},"subject":[]}}