{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:18:18Z","timestamp":1725506298181},"reference-count":8,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.2002.1181722","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T15:35:00Z","timestamp":1056641700000},"page":"266-271","source":"Crossref","is-referenced-by-count":0,"title":["An embedded built-in-self-test approach for analog-to-digital converters"],"prefix":"10.1109","author":[{"family":"Sheng-Hung Hsieh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ming-Jun Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tsin-Yuan Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.650820"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82284"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1999.776041"},{"key":"ref5","first-page":"590","article-title":"Implementation of a Linear Histogram BIST for ADCs","author":"bernard","year":"2001","journal-title":"Proc of Design Automation and Test in Europe"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840042"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/54.544535"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840041"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805806"}],"event":{"name":"Eleventh Asian Test Symposium","acronym":"ATS-02","location":"Guam, USA"},"container-title":["Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8413\/26519\/01181722.pdf?arnumber=1181722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T00:14:09Z","timestamp":1489450449000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1181722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ats.2002.1181722","relation":{},"subject":[]}}