{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T11:01:46Z","timestamp":1730199706024,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/ats.2002.1181749","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T11:35:00Z","timestamp":1056627300000},"page":"429-434","source":"Crossref","is-referenced-by-count":0,"title":["Time slot specification based approach to analog fault diagnosis using built-in current sensors and test point insertion"],"prefix":"10.1109","author":[{"given":"S.","family":"Upadhyaya","sequence":"first","affiliation":[]},{"family":"Jae Min Lee","sequence":"additional","affiliation":[]},{"given":"P.","family":"Nair","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SSMSD.1999.768598"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2001.938528"},{"key":"ref12","first-page":"25","article-title":"Fault diagnosis for linear analog circuits","author":"lin","year":"2000","journal-title":"Proceedings of the Ninth Asian Test Symposium 2000 (ATS 2000)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.285252"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639612"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/101.481204"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.155921"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.106284"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1985.13281"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.206674"},{"key":"ref8","first-page":"467","article-title":"Parameter identification approach to fault diagnosis of switched capacitor circuits","volume":"139","author":"salama","year":"1991","journal-title":"IEE Proc Electron Trans Cir and Syst"},{"key":"ref7","first-page":"28","article-title":"Analog system-Level fault diagnosis based on a symbolic method in the frequency domain","volume":"44","author":"you","year":"0","journal-title":"IEEE Trans Instrum and Meas"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/bltj.2085"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1996.542148"}],"event":{"name":"Eleventh Asian Test Symposium","acronym":"ATS-02","location":"Guam, USA"},"container-title":["Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8413\/26519\/01181749.pdf?arnumber=1181749","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T20:00:05Z","timestamp":1489435205000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1181749\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ats.2002.1181749","relation":{},"subject":[]}}