{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:42:56Z","timestamp":1749620576057},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250781","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"44-49","source":"Crossref","is-referenced-by-count":12,"title":["Efficient diagnosis for multiple intermittent scan chain hold-time faults"],"prefix":"10.1109","author":[{"family":"Yu Huang","sequence":"first","affiliation":[]},{"family":"Huan-Yung Tseng","sequence":"additional","affiliation":[]},{"family":"Wu-Tung Cheng","sequence":"additional","affiliation":[]},{"family":"Alou Huang","sequence":"additional","affiliation":[]},{"family":"Cheng-Ju Hsieh","sequence":"additional","affiliation":[]},{"family":"Yu-Ting Hung","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"ref3","first-page":"217","article-title":"Diagnosis of Scan Chain Failures","author":"wu","year":"1998","journal-title":"Proc Int'l Symp on Defect and Fault Tolerance in VLSI Systems"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/92.335019"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"},{"key":"ref8","article-title":"Down to the wire — requirements for nanometer design implementation","author":"chao","year":"2002","journal-title":"EE Design"},{"key":"ref7","article-title":"Statistical techniques attack process variation","author":"wilson","year":"2003","journal-title":"EE Times"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270854"},{"key":"ref1","first-page":"268","article-title":"A Technique for Fault Diagnosis of Defects in Scan Chains","author":"guo","year":"2001","journal-title":"Proc Int'l Test Conference"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250781.pdf?arnumber=1250781","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T14:41:44Z","timestamp":1489416104000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250781\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250781","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}