{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T12:09:08Z","timestamp":1742386148823,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250798","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"136-141","source":"Crossref","is-referenced-by-count":34,"title":["Optimal scan tree construction with test vector modification for test compression"],"prefix":"10.1109","author":[{"family":"Miyase","sequence":"first","affiliation":[]},{"family":"Kajihara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"778","article-title":"A Mixed Mode Bist Scheme Based on Reseeding of Folding Counters","author":"sybille","year":"2000","journal-title":"Int'l Test Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/288548.288563"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20000544"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968648"},{"key":"ref14","first-page":"341","article-title":"A layout-based approach for ordering scan chain flip-flops","author":"makar","year":"2000","journal-title":"Int'l Test Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011104"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/43.712101"},{"key":"ref17","first-page":"189","article-title":"Test Generation and Dynamic Compaction of Tests","author":"goel","year":"1979","journal-title":"Digest of Papers 1979 Test Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DELTA.2002.994657"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106769"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966696"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378388"},{"key":"ref5","first-page":"301","article-title":"Emebedded deterministic test for low cost manufacturing test","author":"rajski","year":"2002","journal-title":"Proc ITC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011119"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"42","DOI":"10.1049\/ip-cdt:20000188","article-title":"reducing test application time by scan flip-flops sharing","volume":"147","author":"chang","year":"2000","journal-title":"Computers and Digital Techniques IEE Proceedings-"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250798.pdf?arnumber=1250798","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T00:35:17Z","timestamp":1497573317000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250798\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250798","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}