{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:01:21Z","timestamp":1725433281500},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250816","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"236-241","source":"Crossref","is-referenced-by-count":6,"title":["Fault diagnosis for physical defects of unknown behaviors"],"prefix":"10.1109","author":[{"family":"Wen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tamamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Salu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557118"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1996.534592"},{"key":"ref10","first-page":"111","article-title":"Speeding Up the Byzantine Fault Diagnosis Using Symbolic Simulation","author":"huang","year":"2002","journal-title":"Proc VLSI Test Symp"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990260"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894244"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470717"},{"key":"ref7","first-page":"280","article-title":"QUIETEST: A Quiescent Current Testing Methodology for Detecting Short Faults","author":"mao","year":"1990","journal-title":"Proc ICCAD'90"},{"key":"ref2","first-page":"35","article-title":"Do Stuck Fault Models Reflect Manufacturing Defects","author":"beh","year":"1982","journal-title":"Proc Intl Test Conf"},{"key":"ref9","first-page":"282","article-title":"Fault Diagnosis for Static CMOS Circuits","author":"wen","year":"1997","journal-title":"Proc Asian Test Symp"},{"journal-title":"Digital Systems Testing and Testable Design","year":"1990","author":"abramovici","key":"ref1"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250816.pdf?arnumber=1250816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T15:20:51Z","timestamp":1489418451000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250816","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}