{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T19:37:17Z","timestamp":1725478637942},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250836","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"354-359","source":"Crossref","is-referenced-by-count":0,"title":["Minimizing defective part level using a linear programming-based optimal test selection method"],"prefix":"10.1109","author":[{"family":"Yuxin Tian","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Grimaila","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Weiping Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Mercer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0022-0000(88)90003-7"},{"key":"ref11","first-page":"404","article-title":"An Evaluation of Pseudo Random Testing for Detecting Real Defects","author":"tseng","year":"2001","journal-title":"Proc VTS'01"},{"key":"ref12","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-5662-3","author":"vanderbei","year":"2001","journal-title":"Linear Programming Foundations and Extensions"},{"journal-title":"Paralleler und Objektorientierter Simplex-Algorithmus ZIB technical report TR 96–09","year":"1996","author":"wunderling","key":"ref13"},{"key":"ref4","first-page":"268","article-title":"RE-DO-Random Excitation and Deterministic Observation - First Commercial Experiment","author":"grimaila","year":"1999","journal-title":"proceedings VTS 99"},{"key":"ref3","first-page":"31","article-title":"Test Routines Based Upon Symbolic Logic Statements","author":"eldred","year":"2001","journal-title":"Journal of ACM"},{"journal-title":"An Introduction to Probability Theory and Its Applications","year":"1968","author":"feller","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.936380"},{"key":"ref8","first-page":"762","article-title":"All Tests for A Fault Are Not Equally Valuable for Defect Detection","author":"kapur","year":"1992","journal-title":"Proc ITC'92"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/502175.502186"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894304"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893618"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250836.pdf?arnumber=1250836","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,31]],"date-time":"2020-03-31T17:03:52Z","timestamp":1585674232000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250836\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250836","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}