{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T18:46:26Z","timestamp":1769539586849,"version":"3.49.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2003,1,1]],"date-time":"2003-01-01T00:00:00Z","timestamp":1041379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2003,1,1]],"date-time":"2003-01-01T00:00:00Z","timestamp":1041379200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250843","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"390-395","source":"Crossref","is-referenced-by-count":0,"title":["A BIST circuit for I\/sub DDQ\/ tests"],"prefix":"10.1109","author":[{"family":"Hashizume","sequence":"first","affiliation":[{"name":"Tokushima Univ., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Takeda","sequence":"additional","affiliation":[{"name":"Tokushima Univ., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yotsuyanagi","sequence":"additional","affiliation":[{"name":"Tokushima Univ., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tamesada","sequence":"additional","affiliation":[{"name":"Tokushima Univ., Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Miura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"578","article-title":"Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing","author":"arabi","year":"1997","journal-title":"Proc of ITC-97"},{"key":"ref3","first-page":"56","article-title":"A fast and sensitive built-in current sensor for IDDQ testing","author":"lu","year":"1996","journal-title":"Proc of IDDQ Workshop"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893647"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1997.633020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1998.730767"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639709"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990268"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IDDQ.1998.730758"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643987"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527913"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1109\/ATS.1998.741634","article-title":"A High Speed IDDQ Sensor for Low Voltage ICs","author":"hashizume","year":"1998","journal-title":"Proc Seventh Asian Test Symp"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1988.25742"}],"event":{"name":"Proceedings of the Twelfth Asian Symposium, ATS 2003","location":"Xi'an, China","start":{"date-parts":[[2003,11,16]]},"end":{"date-parts":[[2003,11,19]]}},"container-title":["2003 Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250843.pdf?arnumber=1250843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T05:27:11Z","timestamp":1769491631000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1250843\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250843","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}