{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:07:43Z","timestamp":1725498463350},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250846","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T17:17:26Z","timestamp":1080667046000},"page":"406-409","source":"Crossref","is-referenced-by-count":1,"title":["Improvement of detectability for CMOS floating gate defects in supply current test"],"prefix":"10.1109","author":[{"family":"Michinishi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yokohira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Okamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kobayashi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hondo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.265677"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.177407"},{"key":"ref6","first-page":"417","article-title":"CMOS Floating Gate Defect Detection using IDDQTest with DC Power Supply Superposed by AC component","author":"michinishi","year":"2002","journal-title":"Proceedings of the 11th Asian Test Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915071"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36238"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1988.122524"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250846.pdf?arnumber=1250846","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T15:52:53Z","timestamp":1489420373000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250846\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250846","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}