{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:00:21Z","timestamp":1725487221628},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/ats.2003.1250857","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T22:17:26Z","timestamp":1080685046000},"page":"462-467","source":"Crossref","is-referenced-by-count":3,"title":["Assessing software implemented fault detection and fault tolerance mechanisms"],"prefix":"10.1109","author":[{"family":"Gawkowski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sosnowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"416","article-title":"Soft Error Sensitivity Characterisation for Microprocessor Dependability Enhancement Strategy","author":"kim","year":"2002","journal-title":"Proc of IEEE Int Conference on Dependable Systems and Networks"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028916"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937838"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/12.980007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2003.1181897"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/40.259897"},{"key":"ref4","first-page":"75","article-title":"Fault injections and tools","author":"chen","year":"1997","journal-title":"IEEE Computer"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2002.1030194"},{"key":"ref6","first-page":"171","article-title":"Considering workload input variations in error coverage considerations","author":"folkesson","year":"1999","journal-title":"Proceedings of EDCC 2"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.903758"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45416-0_12"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937812"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/12.841127"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990300"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2002.1185622"}],"event":{"name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","start":{"date-parts":[[2003,11,19]]},"location":"Xi'an, China","end":{"date-parts":[[2003,11,19]]}},"container-title":["Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8853\/27997\/01250857.pdf?arnumber=1250857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:39:56Z","timestamp":1489433996000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/ats.2003.1250857","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}