{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:32:24Z","timestamp":1762252344162},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/ats.2015.7447934","type":"proceedings-article","created":{"date-parts":[[2016,4,8]],"date-time":"2016-04-08T02:36:57Z","timestamp":1460083017000},"page":"211-216","source":"Crossref","is-referenced-by-count":28,"title":["On the testability of IEEE 1687 networks"],"prefix":"10.1109","author":[{"given":"R.","family":"Cantoro","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Montazeri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F. Ghani","family":"Zadegan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Larsson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.155"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207851"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865695"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1990.124822"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041802"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.80"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.13"},{"key":"ref7","first-page":"364","article-title":"ATPG for Scan Chain Latches and Flip-Flops","author":"makar","year":"1997","journal-title":"Proc IEEE VLSI Test Symp (VTS)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763228"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1989.82277"},{"year":"0","key":"ref1","first-page":"1687"}],"event":{"name":"2015 IEEE 24th Asian Test Symposium (ATS)","start":{"date-parts":[[2015,11,22]]},"location":"Mumbai","end":{"date-parts":[[2015,11,25]]}},"container-title":["2015 IEEE 24th Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7421875\/7422217\/07447934.pdf?arnumber=7447934","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,9]],"date-time":"2017-03-09T04:55:03Z","timestamp":1489035303000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7447934\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ats.2015.7447934","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}