{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:17:42Z","timestamp":1725754662409},"reference-count":3,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T00:00:00Z","timestamp":1606089600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,11,23]]},"DOI":"10.1109\/ats49688.2020.9301558","type":"proceedings-article","created":{"date-parts":[[2020,12,28]],"date-time":"2020-12-28T15:57:55Z","timestamp":1609171075000},"page":"1-2","source":"Crossref","is-referenced-by-count":5,"title":["Accurate Testing of Precision Voltage Reference by DC-AC Conversion"],"prefix":"10.1109","author":[{"given":"Keno","family":"Sato","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takayuki","family":"Nakatani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takashi","family":"Ishida","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshiyuki","family":"Okamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tamotsu","family":"Ichikawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anna","family":"Kuwana","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazumi","family":"Hatayama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haruo","family":"Kobayashi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00014"},{"journal-title":"Analysis and Design of Analog Integrated Circuits","year":"2009","author":"gray","key":"ref2"},{"journal-title":"Analog Circuit Design","year":"2013","author":"dopkin","key":"ref1"}],"event":{"name":"2020 IEEE 29th Asian Test Symposium (ATS)","start":{"date-parts":[[2020,11,23]]},"location":"Penang, Malaysia","end":{"date-parts":[[2020,11,26]]}},"container-title":["2020 IEEE 29th Asian Test Symposium (ATS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9301474\/9301477\/09301558.pdf?arnumber=9301558","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:36:59Z","timestamp":1656329819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9301558\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11,23]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/ats49688.2020.9301558","relation":{},"subject":[],"published":{"date-parts":[[2020,11,23]]}}}